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An adaptive distributed algorithm for sequential circuit test generation.
James Sienicki
Michael L. Bushnell
Prathima Agrawal
Vishwani D. Agrawal
Published in:
EURO-DAC (1995)
Keyphrases
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test generation
learning algorithm
dynamic programming
k means
parallel version
objective function
cooperative
computational complexity
np hard
detection algorithm
matching algorithm
database
optimal solution
feature selection
distributed systems
expectation maximization
machine learning