Topological Heuristics for Scan Test Overhead Reduction.

Avijit Chakraborty Duncan M. Hank Walker

Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2023)

Keyphrases

test data
connected components
databases
learning algorithm
image segmentation
multiscale
heuristic search
statistical tests
data reduction
software testing
exact algorithms
topological properties
scan data