Design for Diagnosability of CMOS Circuits.
Xiaoqing WenTooru HonzawaHideo TamamotoKewal K. SalujaKozo KinoshitaPublished in: Asian Test Symposium (1998)
Keyphrases
- circuit design
- chip design
- building blocks
- high speed
- high level synthesis
- case study
- cmos technology
- design decisions
- computer aided
- power consumption
- low cost
- user interface
- vlsi circuits
- delay insensitive
- logic circuits
- analog circuits
- low power
- power dissipation
- single chip
- data sets
- design process
- genetic algorithm
- neural network