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On the strain induced by arsenic into silicon.

Stephane KoffelPeter PichlerJürgen LorenzGabriele BisogninEnrico NapolitaniDavide De Salvador
Published in: ESSDERC (2013)
Keyphrases
  • transmission electron microscopy
  • x ray
  • water supply
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  • evolutionary algorithm
  • database
  • artificial intelligence
  • databases
  • electron microscopy