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Bias Stress Stability of ITO Transistors and its Dependence on Dielectric Properties.

Lauren HoangAlwin DausSumaiya WahidJimin KwonJung-Soo KoShengjun QinMahnaz IslamKrishna C. SaraswatH.-S. Philip WongEric Pop
Published in: DRC (2022)
Keyphrases
  • desirable properties
  • structural properties
  • high density
  • data mining
  • circuit design
  • low variance
  • machine learning
  • information systems
  • power consumption