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/Cell Distributed Bulk-Current Sensor and Secure Flush Code Eraser Against Laser Fault Injection Attack on Cryptographic Processor.

Kohei MatsudaTatsuya FujiiNatsu ShojiTakeshi SugawaraKazuo SakiyamaYu-ichi HayashiMakoto NagataNoriyuki Miura
Published in: IEEE J. Solid State Circuits (2018)
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