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Using Boolean Tests to Improve Detection of Transistor Stuck-Open Faults in CMOS Digital Logic Circuits.

Xijiang LinSudhakar M. ReddyJanusz Rajski
Published in: VLSI Design (2015)
Keyphrases
  • low power
  • logic circuits
  • high speed
  • power dissipation
  • power consumption
  • circuit design
  • low cost
  • mixed signal
  • gate array
  • anomaly detection
  • functional decomposition
  • sensor networks
  • infrared
  • fault diagnosis