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Estimating the thickness of ultra thin sections for electron microscopy by image statistics.
Jon Sporring
Mahdieh Khanmohammadi
Sune Darkner
Nicoletta Nava
Jens Rondel Nyengaard
Eva Bjorn Wedel Jensen
Published in:
ISBI (2014)
Keyphrases
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electron microscopy
image statistics
natural images
x ray
low energy
image stacks
natural image statistics
high speed
thin film
natural scenes
object recognition
image patches
feed forward
higher order
feature space
transmission electron microscopy
feature selection