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Multiple stuck-at faults detection in CMOS combinational gates.
Giacomo Buonanno
Fabrizio Lombardi
Donatella Sciuto
Y.-N. Sken
Published in:
Microprocessing and Microprogramming (1991)
Keyphrases
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low cost
detection rate
data sets
detection algorithm
detection method
fault diagnosis
detection accuracy
error detection
logic circuits
neural network
hough transform
automatic detection
parallel processing