Login / Signup
Yield and reliability issues in nanoelectronic technologies.
Denis Teixeira Franco
Jean-François Naviner
Lirida A. B. Naviner
Published in:
Ann. des Télécommunications (2006)
Keyphrases
</>
emerging trends
emerging technologies
human factors
key issues
data mining
technical issues
digital media
reliability analysis
book discusses
reliability assessment
artificial intelligence
computer science
information technology
highly reliable
legal issues