Statistical characterization of chip power behavior at post-fabrication stage.
Yufu ZhangAnkur SrivastavaPublished in: IGCC (2011)
Keyphrases
- high density
- high speed
- statistical analysis
- ibm power processor
- statistical models
- power consumption
- silicon on insulator
- statistical methods
- integrated circuit
- power dissipation
- data driven
- low cost
- real time
- computational power
- statistical information
- human behavior
- statistical tests
- circuit design
- physical design
- host computer