Low frequency noise in nMOSFETs with subnanometer EOT hafnium-based gate dielectrics.
Paolo MagnoneCalogero PaceFelice CrupiGino GiusiPublished in: Microelectron. Reliab. (2007)
Keyphrases
- low frequency
- high frequency
- frequency domain
- wavelet transform
- subband
- wavelet coefficients
- discrete wavelet transform
- frequency band
- wavelet analysis
- electromagnetic fields
- low pass
- original images
- low and high frequency
- dct domain
- gate dielectrics
- high frequency components
- spatial domain
- image reconstruction
- feature vectors
- computational complexity
- image processing