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Characterization of Single Phase Nanometric Cu2O Films Grown by Thermal Oxidation in the Range of 600 to 950° C in an Atmosphere with Low Oxygen Content.

Laura Hill-PastorLucia Juarez-AmadorMarco Vasquez-AgustinMiguel Galvan ArellanoTomas Diaz-BecerrilRamon Peña-Sierra
Published in: CCE (2018)
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