Constant voltage stress characterization of nFinFET transistor during total ionizing dose experiment.
Binhong LiYang HuangJianfei WuYunbo HuangBo LiQingzhu ZhangLing YangFayu WanJiajun LuoZhengsheng HanHuaxiang YinPublished in: Microelectron. Reliab. (2018)