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Constant voltage stress characterization of nFinFET transistor during total ionizing dose experiment.

Binhong LiYang HuangJianfei WuYunbo HuangBo LiQingzhu ZhangLing YangFayu WanJiajun LuoZhengsheng HanHuaxiang Yin
Published in: Microelectron. Reliab. (2018)
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