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Constant voltage stress characterization of nFinFET transistor during total ionizing dose experiment.

Binhong LiYang HuangJianfei WuYunbo HuangBo LiQingzhu ZhangLing YangFayu WanJiajun LuoZhengsheng HanHuaxiang Yin
Published in: Microelectron. Reliab. (2018)
Keyphrases
  • high speed
  • silicon dioxide
  • power system
  • decreasing function
  • low power
  • data sets
  • integrated circuit
  • three dimensional
  • control system
  • small animal