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A guide to graceful aging: How not to overindulge in post-silicon burn-in for enhancing reliability of weak PUF.

Md. Nazmul IslamVinay C. PatilSandip Kundu
Published in: ISCAS (2017)
Keyphrases
  • software aging
  • electronic devices
  • low cost
  • three dimensional
  • reliability analysis
  • high density
  • application server
  • database
  • genetic algorithm
  • high resolution
  • digital images
  • search engine optimization