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Analysis of Single-Trap-Induced Random Telegraph Noise on Asymmetric High-k Spacer FinFET.

Nandakishor YadavAnkur BeoharSantosh Kumar Vishvakarma
Published in: iNIS (2016)
Keyphrases
  • wide range
  • noise reduction
  • real time
  • data sets
  • probability distribution
  • high precision
  • noisy data
  • signal to noise ratio
  • small size
  • random noise
  • high noise