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Automatic fault localization at chip level.

R. D. L. StoutAd J. van de GoorR. E. Wolff
Published in: Microprocess. Microsystems (1998)
Keyphrases
  • fault localization
  • model based diagnosis
  • program slicing
  • software testing
  • program understanding
  • information systems
  • error rate
  • fault detection
  • data mining