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On efficient extraction of partially specified test sets for synchronous sequential circuits.

Aiman H. El-MalehKhaled Al-Utaibi
Published in: ISCAS (5) (2003)
Keyphrases
  • test set
  • error rate
  • test cases
  • computationally expensive
  • database
  • neural network
  • training data
  • training set
  • high speed
  • text categorization
  • test data
  • analog circuits
  • analog vlsi