Statistical Properties of Bit-Plane Probability Model and Its Application in Supervised Texture Classification.
Siu-Kai ChoyChong-Sze TongPublished in: IEEE Trans. Image Process. (2008)
Keyphrases
- probability model
- bit plane
- texture classification
- wavelet subbands
- texture analysis
- statistical model
- texture features
- local binary pattern
- probability distribution
- texture images
- image analysis
- rotation invariant
- transform domain
- low complexity
- feature extraction
- unsupervised learning
- multiresolution
- rate distortion
- probabilistic model
- multiscale
- image coding
- bitstream
- computer vision
- wavelet coefficients
- high dimensional
- object recognition
- texture descriptors
- face recognition
- feature selection