Self-contained built-in-self-test/repair transceivers for interconnects in 3DICs.

Myat Thu Linn Aung Tony T. Kim

Published in: APCCAS (2016)

Keyphrases

built in self test
input output
lower cost
integrated circuit
damage assessment
machine learning
data sets
high speed
databases
learning algorithm
decision making
case study
multiresolution
failure rate
fiber optic
objects represented