Gate Overdrive with Split-Circuit Biasing to Substitute for Body Biasing in FinFET and UTB FDSOI Circuits.
Andrew WhetzelMircea R. StanPublished in: ISVLSI (2016)
Keyphrases
- cmos technology
- analog circuits
- high speed
- tunnel diode
- logic circuits
- analog vlsi
- circuit design
- electronic circuits
- digital circuits
- delay insensitive
- logic synthesis
- multiple input
- human body
- low power
- low voltage
- power dissipation
- social networks
- power reduction
- chip design
- asynchronous circuits
- nano scale
- action selection
- fault diagnosis
- three dimensional