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Automatic test generation for linear digital systems with bi-level search using matrix transform methods.

Rabindra K. RoyAbhijit ChatterjeeJanak H. PatelJacob A. AbrahamManuel A. d'Abreu
Published in: ICCAD (1992)
Keyphrases
  • search methods
  • bi level
  • case study
  • test generation
  • complex systems
  • search algorithm
  • multiresolution
  • knowledge management