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Active feedback circuit for minimization of voltage transients during pulsed measurements of semiconductor devices.
Albert M. Young
Samuel S. Osofsky
Published in:
IEEE Trans. Instrum. Meas. (2001)
Keyphrases
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semiconductor devices
field effect transistors
electron beam
steady state
high density
mathematical analysis
objective function
high speed
power system
multi channel
query processing
relevance feedback
integrated circuit
time of flight
low voltage
duty cycle