A Comparison of Different Defect Measures to Identify Defect-Prone Components.

Tosin Daniel Oyetoyan Reidar Conradi Daniela S. Cruzes

Published in: IWSM/Mensura (2013)

Keyphrases

defect detection
confusion matrices
machine learning
computer vision
image processing
image segmentation
multiscale
preprocessing
artificial neural networks
multiresolution
special case
ground truth
machine vision
software components
quantitative measures
automated visual inspection