A Bayesian-based optimization approach for accelerated degradation test plan of a LED component with self-heating impact.
Minh-Tuan TruongPhuc DoLaurent MendizabalBenoît IungPublished in: ICSC (2022)
Keyphrases
- optimization problems
- efficient optimization
- optimization algorithm
- global optimization
- bayesian networks
- bayesian inference
- optimization methods
- posterior probability
- bayesian analysis
- bayesian learning
- plan recognition
- optimization method
- machine learning
- statistically significant
- posterior distribution
- optimization process
- test cases
- maximum likelihood
- plan execution
- data driven
- simulated annealing
- monte carlo sampling