Defect-Oriented Testing of RF Circuits.

Erkan Acar Sule Ozev

Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2008)

Keyphrases

high speed
radio frequency
delay insensitive
analog circuits
test set
analog vlsi
quantum computing
digital circuits
machine vision
test cases
genetic algorithm
artificial neural networks
search algorithm
multiscale
training data
decision trees
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