Self-Testing in Bit Serial VLSI Parts: High Coverage at Low Cost.

Alan F. Murray Peter B. Denyer David S. Renshaw

Published in: ITC (1983)

Keyphrases

low cost
test suite
single chip
low power
signal processing
test cases
website
real time
vlsi design
case study
multiscale
wide range
code coverage
highly efficient
high speed
software testing
set of test cases
high efficiency
digital images
data structure
image processing
information retrieval
data sets