A test pattern generation unit for memory NPSF built-in self test.

A. Chrisanthopoulos George Kamoulakos Y. Tsiatouhas Angela Arapoyanni

Published in: ICECS (2000)

Keyphrases

built in self test
memory requirements
computing power
limited memory
memory capacity
genetic algorithm
associative memory
memory usage
memory space
decision trees
case study
bayesian networks
computational complexity
relational databases
data management
data sets
computational power