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Electromigration Test Chip Experiments from Realistic Power Grid Structures: Failure Trend Comparison and Statistical Analysis.
Yong Hyeon Yi
Chris H. Kim
Armen Kteyan
Alexander Volkov
Stéphane Moreau
Valeriy Sukharev
Published in:
IRPS (2024)
Keyphrases
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statistical analysis
power grid
power system
smart grid
communication networks
low cost
high speed
statistical methods
cyber security
neural network
artificial intelligence
wireless sensor networks
critical infrastructure