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Fast construction of test-program generators for digital signal processors.

Shai RubinMoshe LevingerRandall R. PrattWilliam P. Moore
Published in: ICASSP (1999)
Keyphrases
  • digital signal processors
  • test cases
  • test data
  • data generator
  • case study
  • np hard
  • machine learning
  • artificial intelligence
  • parallel algorithm
  • test suite
  • field programmable gate array