3D IC Memory BIST Controller Allocation for Test Time Minimization Under Power Constraints.
Yen-Chun KoShih-Hsu HuangPublished in: ATS (2017)
Keyphrases
- built in self test
- integrated circuit
- control system
- matlab simulation
- allocation scheme
- power consumption
- neural network
- linear constraints
- optimal control
- global constraints
- computational power
- memory usage
- control architecture
- power dissipation
- constraint satisfaction
- constrained minimization
- control algorithm
- resource constraints
- memory requirements
- allocation strategy
- test data
- real time