A field-programmable lab-on-a-chip with built-in self-test circuit and low-power sensor-fusion solution in 0.35μm standard CMOS process.
Kelvin Yi-Tse LaiMing-Feng ShiuYi-Wen LuYingchieh HoYu-Chi KaoYu-Tao YangGary WangKeng-Ming LiuHsie-Chia ChangChen-Yi LeePublished in: A-SSCC (2015)
Keyphrases
- low power
- high speed
- single chip
- sensor fusion
- low cost
- cmos technology
- signal processor
- power dissipation
- logic circuits
- mixed signal
- power consumption
- low power consumption
- power reduction
- real time
- nm technology
- vlsi circuits
- delay insensitive
- high power
- image sensor
- digital signal processing
- gate array
- mobile robot
- vlsi architecture
- ultra low power
- low voltage
- circuit design
- multi sensor
- inertial sensors
- analog vlsi
- cmos image sensor
- parallel processing
- focal plane
- integrated circuit
- built in self test
- general purpose
- video sequences