Scalable algorithm for structural fault collapsing in digital circuits.
Raimund UbarLembit JurimagiElmet OrassonJaan RaikPublished in: VLSI-SoC (2015)
Keyphrases
- cost function
- learning algorithm
- digital circuits
- computational complexity
- single pass
- dynamic programming
- experimental evaluation
- computational cost
- k means
- preprocessing
- similarity measure
- database
- structural information
- times faster
- high accuracy
- simulated annealing
- databases
- recognition algorithm
- clustering method
- segmentation algorithm
- worst case
- probabilistic model
- objective function
- optimal solution
- np hard
- significant improvement