Unsupervised novelty pattern classification of shmoo plots for visualizing the test results of integrated circuits.
Hyun Soo ShinYoungju KimChang Ouk KimSung Ho ParkPublished in: Expert Syst. Appl. (2022)
Keyphrases
- pattern classification
- integrated circuit
- novelty detection
- built in self test
- nearest neighbor rule
- pattern recognition
- feature extraction
- probabilistic neural network
- pattern classification problems
- vowel recognition
- supervised learning
- fuzzy classifier
- electron beam
- unsupervised learning
- human identification
- parzen window
- decision boundary
- radial basis function neural network
- machine learning
- neural network
- mutual information
- low cost
- semi supervised
- linear dimensionality reduction
- multiscale
- face recognition