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Efficient circuit failure probability calculation along product lifetime considering device aging.
Hiromitsu Awano
Masayuki Hiromoto
Takashi Sato
Published in:
ASP-DAC (2017)
Keyphrases
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high speed
semiconductor devices
computationally expensive
information systems
failure rate
real time
genetic algorithm
video sequences
fault diagnosis
cost effective
life cycle
circuit design
field effect transistors