Reliability studies on GaN HEMTs with sputtered Iridium gate module.

Richard Lossy Hervé Blanck Joachim Würfl

Published in: Microelectron. Reliab. (2012)

Keyphrases

empirical studies
data sets
data mining
neural network
image processing
case study
three dimensional
database systems
multiscale
multi agent
structuring elements
reliability analysis