AI-based 3D Metrology and Defect Detection of HBMs in XRM Scans.
Richard ChangWang JieNamrata ThakurRamanpreet Singh PahwaPublished in: World Sci. Annu. Rev. Artif. Intell. (2023)
Keyphrases
- defect detection
- artificial intelligence
- feature extraction
- camera calibration
- machine learning
- expert systems
- process control
- intelligent systems
- ai community
- ai systems
- automated visual inspection
- case based reasoning
- knowledge based systems
- john mccarthy
- ai methods
- single view
- computer vision
- social networks
- ai technologies
- artificial intelligent
- databases
- data sets
- knowledge representation
- three dimensional
- intelligent behavior
- general intelligence
- information retrieval
- artificial intelligence in education