A built-in self-test scheme for the post-bond test of TSVs in 3D ICs.

Yu-Jen Huang Jin-Fu Li Ji-Jan Chen Ding-Ming Kwai Yung-Fa Chou Cheng-Wen Wu

Published in: VTS (2011)

Keyphrases

built in self test
integrated circuit
detection scheme
website
learning scheme
recognition scheme
machine learning
learning algorithm
artificial intelligence
data structure
evolutionary algorithm
software testing