Analog Circuit Test Using Transfer Function Coefficient Estimates.

Zhen Guo Jacob Savir

Published in: IEICE Trans. Inf. Syst. (2004)

Keyphrases

transfer function
analog circuits
low pass filter
fault diagnosis
contrast enhancement
neural network
digital circuits
image enhancement
pattern recognition
image analysis
genetic algorithm
real time
wavelet packet transform
high speed
support vector
high dynamic range
artificial intelligence