Temperature-Gradient-Based Burn-In and Test Scheduling for 3-D Stacked ICs.

Nima Aghaee Zebo Peng Petru Eles

Published in: IEEE Trans. Very Large Scale Integr. Syst. (2015)

Keyphrases

high temperature
scheduling problem
information retrieval
scheduling algorithm
test data
social networks
information systems
website
statistical tests