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Constructive Multi-Phase Test Point Insertion for Scan-Based BIST.

Nagesh TamarapalliJanusz Rajski
Published in: ITC (1996)
Keyphrases
  • built in self test
  • data sets
  • social networks
  • hidden markov models
  • real time
  • neural network
  • information retrieval
  • clustering algorithm
  • multiscale
  • data structure
  • statistical significance