Login / Signup

Robust X-Ray Phase Ptycho-Tomography.

Singanallur V. VenkatakrishnanMaryam FarmandYoung-Sang YuHasti MajidiKlaus van BenthemStefano MarchesiniDavid A. ShapiroAlexander Hexemer
Published in: IEEE Signal Process. Lett. (2016)
Keyphrases