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Benchmarking of nanometer technologies for DPA-resilient DPL-based cryptocircuits.

Erica Tena-SánchezIgnacio M. Delgado-LozanoJuan NúñezAntonio J. Acosta
Published in: DCIS (2018)
Keyphrases
  • countermeasures
  • human factors
  • data sets
  • decision making
  • learning environment
  • st century
  • electron microscopy
  • machine learning
  • three dimensional
  • query processing