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Benchmarking of nanometer technologies for DPA-resilient DPL-based cryptocircuits.
Erica Tena-Sánchez
Ignacio M. Delgado-Lozano
Juan Núñez
Antonio J. Acosta
Published in:
DCIS (2018)
Keyphrases
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countermeasures
human factors
data sets
decision making
learning environment
st century
electron microscopy
machine learning
three dimensional
query processing