Wafer Scale Integration: A university perspective.

Vijay K. Jain David L. Landis David C. Keezer K. T. Wilson D. Whittaker

Published in: J. VLSI Signal Process. (1991)

Keyphrases

scale space
viewpoint
information retrieval
case study
data fusion
web services
integrated circuit
e learning
massively parallel
multiple perspectives
database
state university
scale invariant
information integration
edge detection
database systems
decision trees
image processing
real world