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Yield and Reliability Improvement Techniques for Emerging Nonvolatile STT-MRAM.

Wang KangLiuyang ZhangWeisheng ZhaoJacques-Olivier KleinYouguang ZhangDafine RavelosonaClaude Chappert
Published in: IEEE J. Emerg. Sel. Topics Circuits Syst. (2015)
Keyphrases
  • design considerations
  • data mining
  • emerging trends
  • random access memory
  • database
  • computer vision
  • database systems
  • highly reliable
  • reliability analysis