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Robust test pattern generation for hold-time faults in nanometer technologies.

Yu-Hao HoYo-Wei ChenChih-Ming ChangKai-Chieh YangJames Chien-Mo Li
Published in: VLSI-DAT (2017)
Keyphrases
  • computationally efficient
  • fault diagnosis
  • data mining
  • feature descriptors
  • robust estimation
  • emerging technologies