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Study of short-circuit robustness of SiC MOSFETs, analysis of the failure modes and comparison with BJTs.

Cheng ChenDenis LabrousseStéphane LefebvreMickael PetitCyril ButtayHervé Morel
Published in: Microelectron. Reliab. (2015)
Keyphrases
  • statistical analysis
  • failure modes
  • neural network
  • artificial neural networks
  • computer aided
  • fuzzy systems