Detection of Apple Defects Based on the FCM-NPGA and a Multivariate Image Analysis.
Wenzhuo ZhangJuan HuGuoxiong ZhouMingfang HePublished in: IEEE Access (2020)
Keyphrases
- data sets
- image analysis
- automatic detection
- computer aided
- defect detection
- visual inspection
- detection accuracy
- false alarms
- fuzzy c means
- image understanding
- neural network
- automated detection
- multivariate data
- detection rate
- false positives
- detection method
- detection algorithm
- scale space
- image segmentation
- clustering algorithm
- image processing
- computer vision
- image enhancement
- regression model
- fuzzy clustering
- feature detection
- object recognition
- generalized likelihood ratio