A test-path determination method based on define-use chains: Test conditions and program fault overlooks.
Takeshi NakajoIchiro YamaguchiHitoshi KumePublished in: Systems and Computers in Japan (1993)
Keyphrases
- test data
- preprocessing
- clustering method
- high accuracy
- experimental evaluation
- dynamic programming
- similarity measure
- fault diagnosis
- synthetic data
- computational cost
- prior knowledge
- significant improvement
- computational complexity
- training set
- fault tree
- post hoc
- optimal path
- test suite
- evaluation method
- fully automatic
- neural network
- detection method
- pairwise
- optimization algorithm
- theoretical analysis
- support vector machine
- classification accuracy
- probabilistic model