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Built-In Self-Test for PEs of Coarse Grained Dynamically Reconfigurable Devices.

Kentaroh KatohHideo Ito
Published in: ETS (2006)
Keyphrases
  • coarse grained
  • fine grained
  • built in self test
  • high level
  • mobile devices
  • protein sequences
  • genetic algorithm
  • shared memory
  • knowledge representation
  • contact maps